International workshop on electron energy loss spectroscopy and Imaging (EELSI)KRIVANEK, Ondrej L.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, issn 1154-2799, 166 p.Conference Proceedings

Electron energy loss spectroscopy and imaging. I: Techniques. II: InstrumentationKRIVANEK, Ondrej L.Ultramicroscopy. 1995, Vol 59, Num 1-4, issn 0304-3991, 292 p.Conference Proceedings

Progress in electron Compton scatteringSCHATTSCHNEIDER, P; EXNER, A.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 241-253, issn 0304-3991Conference Paper

The resolution limit for elemental mapping in energy-filtering transmission electron microscopyKOHL, H; BERGER, A.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 191-194, issn 0304-3991Conference Paper

Cryo-electron energy loss spectroscpy: observations on vitrified hydrated specimens and radiation damageLEAPMAN, R. D; SUN, S.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 71-79, issn 0304-3991Conference Paper

Phase identification in carbon and BN systems by EELSSCHMID, H. K.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 99-111, issn 1154-2799Conference Paper

Some practical consequences of the Lorentzian angular distribution of inelastic scatteringEGERTON, R. F; WONG, K.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 169-180, issn 0304-3991Conference Paper

Conduction bandstructure in strained silicon by spatially resolved electron energy loss spectroscopyBATSON, P. E.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 63-70, issn 0304-3991Conference Paper

Delocalization in inelastic scatteringMULLER, D. A; SILCOX, J.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 195-213, issn 0304-3991Conference Paper

Energy-filtered transmission electron microscopy of Si_mGein superlattices and Si-Ge heterostructures. I: experimental resultsJÄGER, W; MAYER, J.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 33-45, issn 0304-3991Conference Paper

EELS-ESI identification of heterogeneous suspensions of aquatic microparticlesPERRET, D; LIENEMANN, C.-P; MAVROCORDATOS, D et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 41-51, issn 1154-2799Conference Paper

Development of the EXELFS technique for high accuracy structural informationQIAN, M; SARIKAYA, M; STERN, E. A et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 137-147, issn 0304-3991Conference Paper

Electron energy loss near edge structure (ELNES) on the carbon K-edge in transition metal carbides with the rock salt structureCRAVEN, A. J; GARVIE, L. A. J.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 89-98, issn 1154-2799Conference Paper

Dispersion of the valence electron energy loss in thin amorphous carbon films deposited by ion assisted evaporation of graphiteFALKE, U; WEBER, A.-K; ULLMANN, J et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 113-120, issn 1154-2799Conference Paper

Electron energy loss spectroscopy study of iron deposition in human alveolar macrophages: ferritin or hemosiderin?DIOCIAIUTI, M; FALCHI, M; PAOLETTI, L et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 33-40, issn 1154-2799Conference Paper

Imaging of nanometer-sized precipitates in solids by electron spectroscopy imagingHOFER, F; WARBICHLER, P; GROGGER, W et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 15-31, issn 0304-3991Conference Paper

In situ EELS and TEM observation of boron carbide (B₄C) during hydrogen- and helium-ion bombardmentsKUSHITA, K; HOJOU, K; FURUNO, S et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 149-157, issn 1154-2799Conference Paper

Quantitative surface chemical mapping with Auger and backscattered electron signalsPRUTTON, M; BARKSHIRE, I. R; CRONE, M et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 47-62, issn 0304-3991Conference Paper

An imaging filter for high voltage electron microscopyGUBBENS, A. J; KRAUS, B; KRIVANEK, O. L et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 255-265, issn 0304-3991Conference Paper

Electron energy-loss near-edge structure of metal-alumina interfacesSCHEU, C; DEHM, G; MÜLLEJANS, H et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 19-31, issn 1154-2799Conference Paper

High spatial resolution extended energy loss fine structure investigations of silicon dioxide compoundsZOU WEI YUAN; CSILLAG, S; TAFRESHI, M. A et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 149-157, issn 0304-3991Conference Paper

An EELS and XAS study of cubic boron nitride synthesized under high pressure-high temperature conditionsJAOUEN, M; HUG, G; GONNET, V et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 127-139, issn 1154-2799Conference Paper

Analyzing line scan EELS data with neural pattern recognitionGATTS, C; DUSCHER, G; MÜLLEJANS, H et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 229-239, issn 0304-3991Conference Paper

Energy-filtered convergent-beam diffraction: examples and future prospectsMIDGLEY, P. A; SAUNDERS, M; VINCENT, R et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 1-13, issn 0304-3991Conference Paper

Recent studies of near-edge structureBROWN, L. M; WALSH, C. A; DRAY, A et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 121-125, issn 1154-2799Conference Paper